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laser spike annealing
As the metal is heated, oxygen is diffused below the surface. We developed an LSA tool that uses infrared light to create a short laser spike with a long wavelength: 10.6m at 600 watts of power to raise the temperature of the silicon for 150-200 microseconds precisely where the laser couples with the silicon. We use a CO 2 laser with a 60 W continuous wave (CW) maximum output, operating at a wavelength of 10.6 m . At Veeco, we invented LSA, and our processes and tools serve the entire spectrum of the annealing roadmap, including logic, DRAM, 3D NAND, emerging memory and other advanced applications. With MSA, because of the short duration, agglomeration does not occur until ~900C. - Use combination of thermal/electrical . "To date, we have demonstrated transistors down to 30 nm using the technology, and at this point we are ready to demonstrate circuits as well," he said. 442 0 obj <> endobj Lower leakage and better surface morphology are also observed in hafnium-based, high-k films when annealed by a laser. Activation can be improved using MSA in combination with additional implantation. In both cases, a reduced volume of substrate is heated to high temperature by a powerful light source, which results in fast temperature ramping compared to conventional RTP. Adobe d The junction depth, abruptness and resistance Focus on Laser Spike Annealing & AP Lithography tools. Laser-annealing technology is about four decades old, but was generally considered to be incapable of handling the spatial nonuniformities on a semiconductor wafer full of varying device geometries. endstream endobj 264 0 obj <> endobj 265 0 obj <> endobj 266 0 obj <> endobj 267 0 obj <> endobj 268 0 obj <> endobj 269 0 obj <> endobj 270 0 obj <>stream In addition, LSA using multiple beams, which can control the depth of the activation area by using different wavelengths, is also being actively studied to anneal the confined area . For comparison, T-t regimes of conventional RTA and nanosecond melt laser annealing are also shown. GaN Compounds; III-V Semiconductors; Raman Spectroscopy; Thermoreflectance; Chemical engineering; Thermal Imaging; Materials Science; Laser Annealing. It uses coherent optics to generate a longer, more focused laser beam at the wafer plane, increasing throughput by approximately 200% compared to its predecessor, the LSA100A. Specifically, the initial starting state is retained to extreme temperatures as polymer motion is suppressed. echo date('Y'); ?> Gold Flag Media LLC. %%EOF Even if some of the chromium oxides is scratched off, a new layer of chromium oxide will form, maintaining the metals corrosion resistance and chemical passivity. The study shows that both disordering (Figure 3a) and ordering (Figure 3b) can be kinetically suppressed at sub-millisecond timescales. The metal begins to oxidize internally. Laser annealing consists of the slow heating of metals with a laser beam. The METHODS FOR OVERLAY IMPROVEMENT THROUGH FEED FORWARD CORRECTION patent was . The inset is rescaled to highlight the Between these two technologies, the choice is not always easy. 0000001684 00000 n Our dual-beam technology was designed to eliminate the need for dopant deactivation. In addition to front-end and middle-of-line applications, there are also opportunities at the back-end. LSA extended process space. Over the last decade, new process technologies and materials have emerged, such as strained silicon, high-k/metal gate (HKMG) and advanced silicide. However, typical thermal annealing is slow, and polymers may degrade at high annealing temperature. W:R9nsLvc{C"Nwc;sf={@ySY_[UYEN]@{'RS1q%}O> %7Q{Y:-1Z85@Rj X07? Comparison of simulated temperature profiles between long dwell laser and flash annealing. evolve into the spike structures that characterize black silicon (Fig. For peak annealing temperatures near 430 C and a 1 ms dwell, TFTs exhibit saturation field-effect mobilities above 70 cm{sup 2}/V-s (V{sub on} 3 V), a value over 4 times higher than furnace . A modified scheme to tune the Schottky Barrier Height (SBH) of NiSi effectively by means of dopant segregation (DS) technique is presented. The junction depth, abruptness and resistance offered by each approach are balanced against device uniformity, deactivation and leakage. individual spectra. The thickness of the internal oxide layer is determined by the highest temperature reached by . The Infona portal uses cookies, i.e. Hence a single laser spike annealed trace provides a cross section of the thermal history of the annealing process. www.laserfocusworld.com is using a security service for protection against online attacks. 0000001737 00000 n We place cookies on your device to give you the best user experience. For short-wavelength 1.E-05 MSA tools such as Flash Anneal (FA) or diode laser annealing (a) (a) (DL) the WID temperature range can be anywhere from 100- 1.E-06 250oC, and is highly dependent on device layout. We doesn't provide 380v corn puff making machine products or service, please contact them directly and verify their companies info carefully. 0000001599 00000 n A laser processing tool is only as good as the motion equipment underneath it. Technical details are considered proprietary, but the method basically involves shaping the output beam of a solid-state laser to provide uniform illumination for a step-and-repeat process. Alan Jacobs from Mike Thompsons group and Clemens Liedel from Chris Obers group, both at the Department of Materials Science and Engineering, brought samples to CHESS D1 station for a detailed analysis of laser annealed traces. Since 1994, Verdant, originally sponsored by Sematech and DARPA in addition to Ultratech, has had 25 patents issued and has applied for 40 more. S/D anneal: Higher activation, improved NMOS strain For laser spike annealing temperatures above 1000 C , mobility is found to degrade due to partial relaxation and dislocation formation in the Si <sub>0.3</sub> Ge <sub>0.7</sub> channel. Tpk = 1200C, dwell time = 10ms, preheat T = 800C for flash. The colored look of the metal that has been processed through laser annealing can be explained by the thin-film interference phenomenon. (A. M. Maxam and W. Gilbert, Methods of Enzymology, 1980, 65: 499-560), matrix-assisted laser desorption ionization time-of-flight (MALDI . In this article the terms LSA and MSA are used interchangeably. n+c(]x>"hv3&m bW+1+xrA$udaooeD NUB,b@K7v |`4$;De3;Z t1O+uX|1FzBanN4{fU1 K8 Since the thermal stress is localized, the backside can be chucked to facilitate heat sinking. Therefore, the parameters of the writing and passivation need to be optimized in order to create a high-quality marking and ensure that the metal is still protected from corrosion. The difference in heat dissipation has a significant impact on the cooling rate, in particular, when long annealing or high intermediate (preheat) temperature is used. Veeco's leading laser spike annealing (LSA) technology is a key differentiator for leading semiconductor manufacturers due to its low thermal budget, Liked by Kui Lin. Simulated temperature distribution in silicon substrate by millisecond nonmelt scanning laser (left) and flash lamp heating (right). 0000002032 00000 n One example is low-k curing. Installed at leading IDM's and Foundries globally, Veeco's LSA101 System is the preferred technology for high-volume manufacturing of advanced logic devices from the 40nm to 14nm nodes. The two waves interfere either constructively or destructively, giving a particular color to the metal. Constructing spike-like energy band alignment at the heterointerface . Construction of Polypyrrole-Coated CoSe 2 Composite Material for Lithium-Sulfur Battery 0000001499 00000 n As FinFETs shrink, interface contact resistance, Rc, becomes more critical (FIGURE 5). FIGURE 2. Medical computer scientists calculated the . 0000003433 00000 n With dimensions approaching atomic scales, the need for low thermal budget processes offered by millisecond annealing (MSA) becomes more important to precisely control the impurity profiles and engineer interfaces. LSA technology uses a long wavelength p-polarized CO2 laser with Brewster angle incidence. A devices thermal budget is a time/temperature calculation. Laser-spike annealing (LSA), developed by Cornell researchers backed by Semiconductor Research Corp. (Research Triangle, N.C.) , has already been tested for both 193-nanometer immersion lithography and 13-nm extreme ultra violet (EUV). The oxide layer also absorbs a fraction of the light that passes through it. The invention discloses a method for preparing ohmic contact of p-type gallium arsenide. Laser annealing is particularly interesting for the identification of medical equipment as it doesnt create any nooks or crannies that might enhance bioburden. Built on Veecos customizable Unity Platform, LSA 101s scanning technology delivers fundamental advantages in uniformity and low-stress processing. CHESS users come from around the world and represent both academic and corporate communities. DHEM clearly indicates the sharp interface between the p-type substrate and the n-type epi-layer and its depth . In response to increasingly complex process demands, Veeco developed a dual beam technology which expands the application space of non-melt laser annealing and features a second low-power laser beam to enable low-temperature processing. Short dwell time is beneficial for reducing wafer warpage and litho misalignment, especially for devices with high strain. This article will explain how LSA technology plays an enabling role to overcoming manufacturing challenges for sub-20nm logic devices. This opens new opportunities for short time scale annealing. !,\8'9<5oRmy+$%q?\Yg gVdR2xW\%p Au"C4q,xV'3DE"jy$o.1iHWfnc4A ':]!9FyE2iq{8d}\KAFc&Zxu?g%#JU~Ct1` ' =~XFJ[2=!>Q0*.JjUMqcI` #X _p?Vu)YF6m Uw\d*wJx! ^B^bF)4D0eBVUH cI"A2>OtXe$SS2 I 5 3*7@ :^a] 0000001364 00000 n Light shone on a metal surface that has been annealed is split into two waves. Global capital spending on semiconductor equipment is projected to grow 21.1 percent in 2014 and 21.0 percent in 2015. Low thermal budget processing by MSA provides a way to alleviate this issue. Long dwell time (2~40ms) adds more thermal budget for defect curing. Here, we demonstrate single scan laser spike annealing (ssLSA) on CdSe nanocrystal (NC) thin films as an experimental test bed to illustrate how the size-dependent photoluminescence (PL) emission can be tuned throughout the visible range and in spatially defined profiles during a single annealing step. A pioneer of laser processing, Ultratech developed laser spike anneal technology, which increases device yield, improves transistor performance and enables the progression of Moore's Law for 32-nm and below production of state-of-the-art consumer electronics. A picture of the promising performance in terms of laser anneal for dopant activation is illustrated in Fig. Essentially, the temperature has to be high enough to activate the dopants, but not too high to overheat the device. 0000018725 00000 n At the same time, advanced applications like 5G, artificial intelligence and machine learningcombined with situations like the current chip shortageare calling for foundries, IDMs and memory manufacturers to ramp capacity of all its technology, from legacy to leading-edge. In this work, we report on properties of IGZO TFTs fabricated using laser spike annealing (LSA) with a scanned continuous wave CO{sub 2} laser. The marking process can generate different colors: blues, browns and yellows. The Medical Laser Center Lbeck developed a handpiece as a fusion of OCT optic and laser handheld. During laser annealing, the chromium oxide layer melts away. 0000000016 00000 n FIGURE 4 shows the schematics of our patented micro-chamber approach that allows ambient control to be implemented in a scanning system using non-contact gas bearing. Based on laser-annealing technology developed at Stanford University (Stanford, CA) and Lawrence Livermore National Laboratory (Livermore, CA), engineers at Ultratech Stepper (San Jose, CA) have progressed to an alpha product level in a tool to fabricate significantly shallower and more abrupt transistor junctions than are currently available through rapid thermal processing (RTP). 1D-E. Spike in experiments for FAM101A and FAM101A AS. However, typical thermal annealing is slow, and polymers may degrade at high annealing temperature. Spike Timing-Dependent Plasticity in the Address Domain R. Vogelstein, Francesco Tenore, . The European semiconductor equipment market is expected to grow along with the world market. 0000019967 00000 n During laser annealing, thermodynamic limits were also approached including materials decomposition and damage, which ultimately limited full characterization of the activation behaviors. Laser Spike Annealing of III-V Materials and Full-Field Thermal Imaging during Laser Spike Annealing ", Laser-annealing technology is about four decades old, but was generally considered to be incapable of handling the spatial nonuniformities on a semiconductor wafer full of varying device geometries. FIGURE 3. Laser annealing can only be used on titanium, steel and stainless steel. Lastly, LSA has also proven beneficial in back-end lithography applications, such as replacing the hot-plate approach for annealing photoresist films. LSA 101 Laser Spike Anneal System. The unique nature of the LSA platform enables our . Doping profiles have been . 0000004641 00000 n The firm's LSA100 and flagship LSA101 tools can be used to make ultra-shallow junctions and highly activated source/drain contacts in both logic chips and LEDs, states the company on its web site. Looking at the metal, you can see the light that is coming towards you as a superposition of the light reflected by the superficial oxide layer and the light reflected by the substrate. Conventional NiSi processing involves two RTA steps. We pulse the laser. The method includes performing laser spike annealing of a surface of a wafer by: generating with a plurality of fiber laser systems respective CW output radiation beams that partially overlap at the wafer surface to form an elongate annealing image having a long axis and a length L A along the long axis; heating at least a . "The numbers that are required at this point are in the 100- to 300- range. Temperature profiles were carefully calibrated in the lab for different laser power levels and dwell times. hXKSHWQNa9& l%j9Tx=Y|siZhX}A~dX'(pWjIYV%'ezdwp ShHH5N?99_@aTz;Yj* 0000002069 00000 n ~Ot2_'x:&T(i Nx[,9;KeB2|556g8]ci[5C;O FIGURE 4. xref How to assure the process repeatability, uniformity and precise control focused laser beam to avoid overlaps . Inset shows details magnified around peak temperature. Manufacturers who need permanent markings for traceability typically have two options: dot peen marking or laser marking. The company's first commercial product based on the new LTP technology platform will be for laser spike annealing (LSA), which will enable ultra-shallow junction formations for multiple generations. JavaScript is disabled for your browser. Ultratech's LSA201 LSA system built on the highly customizable Unity Platform includes a patented micro chamber for full-wafer, ambient control for processing . The user team acquired close to 100,000 images on a fast Pilatus 200k detector corresponding to 3 sample materials with ~40 laser traces each. 2018Proposal/BTR deadline: 12/1/17 This is because once the flash energy is dissipated through the wafer thickness, the cooling is limited by the same radiation loss mechanism as in RTP. trailer The LSA101 system enables critical millisecond annealing applications that allow customers to maintain precise, targeted high processing temperatures, and thus achieve gains in device performance, lower leakage, and higher yield. Local Resistance Profiling of Ultra Shallow Junction Annealed with Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscope. Previous studies have shown that such configuration has benefits of reduced pattern density effect compared to short wavelength with near normal incidence. Veeco is the industry leader driving HDD manufacturing to new levels of productivity. This book offers after an historical excursus selected contributions on fundamental and applied aspects of thermal processing of classical elemental semiconductors and other advanced materials including nanostructures with novel . 0000000656 00000 n In-situ doped selective epitaxial growth is increasingly used to form the raised source/drain for FinFET. Laser texturing can enhance optical density through excellent light trapping as shown in Figure 1 [3]. Figure 1a schematically shows the laser spike annealing procedure, where a focused laser beam from a 120 W infrared CO2 laser (=10.6 m) is swept across the sample. 0000005379 00000 n And in most cases, not just any chips will do. CHESS is operated and managed for the National Science Foundation by Cornell University. Laser thermal treatment of organosilicate coatings in a process characterized by extremely short dwell times and extremely high temperatures, generally referred to as laser spike anneal (LSA) appears to be a viable approach to post-porosity enhancement of mechanical properties. So it is a step and repeat process, very much like a stepper.". Copyright 2023 Veeco Instruments Inc. All Rights Reserved. Because laser-spike annealing (LSA) activates S/D dopants within local and selective areas in a short time, LSA has been extensively used to moderate thermal issues. 0000001279 00000 n Laser Spike Annealing (LSA) is a powerful technique for investigating reaction kinetics at high temperatures in the sub-millisecond time regime. Drastic FinFET performance improvement has been achieved with co-optimization of conformal doping, selective epitaxial growth, implantation and MSA. 0000004092 00000 n WL LI works at Institute of Frontier and Interdisciplinary Scienc and is well known for Residual Stress, Rectangular Plate and Cylindrical Shells. But as for a simple scratch, a new passivated layer will be created spontaneously, thereby preserving the stainless steel from further deterioration. Recently a group at Cornell University devised a scheme for ultrafast heating of polymer films using laser spike annealing [1]. High temperature promotes phase mixing of Si-rich Ni silicide at the silicide/Si interface and lowers Schottky barrier height (SBH). 0000003342 00000 n The modulus and hardness of the low-k films can be improved without adversely impacting the k value using MSA. \Ik.8p2h0,`j R3\s1aqfL\ *t60O!_|AA@0205e 3 a These devices must be the most advanced, most reliable chips available to meet the requirements of todays computing needs. 0000006352 00000 n With laser annealing, it is possible to color the surface of very specific metals: Laser annealing is very different from other laser marking mechanisms read, Basic Principles of Laser Annealing - Thin Film Interference, Figure 1 - Thin film interference (transmission and reflections), A first reflection occurs when ambient light rays hit the, Looking at the metal, you can see the light that is coming towards you as a superposition of the, Figure 2 -Constructive and desctructive interference, Figure 3 - Thin film interference (absorption), Figure 4 -Different colors achieved with laser annealing on a stainless steel sample, Laser Annealing of Stainless Steel: Typical Applications, These properties are assured by the presence of a layer of, Even if some of the chromium oxides is scratched off, a new layer of chromium oxide will form, maintaining the metals, Laser Annealing Can Be Usedfor Industrial Applications, 7 Considerations Before Laser Engraving Metals, How to Choose the Best Marking Technology, Laser Markers vs Dot Peen Marking Machines: What to Choose and Why. PLAINVIEW, N.Y., Nov. 22, 2021 (GLOBE NEWSWIRE) - Veeco Instruments Inc. (NASDAQ: VECO) today announced they have shipped the first LSA101 Laser Spike Annealing System from their new San Jose, California facility to a leading semiconductor manufacturer. 2021 Cornell University Library | Privacy | Web Accessibility Assistance. (UTEK-G) SOURCE Ultratech, Inc. Goals. 2023 Cornell High Energy Synchrotron Source, Run, run, as fast as you can laser spike annealing of block copolymer films, In-Person User Orientation and Safety Training, Calculator for absolute flux measurement using XPD100, Characteristic emission lines of the elements. This process is automatic. With MSA, junctions with enhanced activation and reduced diffusion can be obtained. Close. RTP uses lamp sources to heat the silicon very quicklyon the order of secondsto temperatures of about 1000C, Talwar said. 0000002958 00000 n In fact, we are the only solution provider that delivers all advanced anneal requirements. 18, 697701 (2011). <]>> Alternatively, LSA uses a single narrow laser beam to heat the wafer surface from substrate temperature to the peak annealing temperature. Jacobs developed software for automatic analysis of these traces; this involved background fitting and integrating the intensity of the first order peaks (see Figure 2). Mounted on an X-Y stage, the wafer is scanned under a stationary, shaped laser beam to locally heat and anneal exposed areas as . Previously thought impractical for semiconductor-scale manufacturing applications, laser annealing is likely to take on a key role as the semiconductor industry proceeds toward sub-100-nm feature sizes, according to Somit Talwar, who described the technology in July at the Semicon West exhibition in San Francisco, CA (see figure). Comments won't automatically be posted to your social media accounts unless you select to share. Sub-20nm system-on-chip and FinFET devices have specific manufacturing challenges that can be resolved with laser spike annealing (LSA) technology. Meanwhile, the junction depth can be controlled by the low-temperature annealing process prior to the laser . 1w ZAWe 1K=5aYeZT-mc!J [3-fBE0hg'`V6_1*Jf.^Sc&_e"%{NW0- "At this point we have demonstrated enough results to show that these are solvable and that they have been solved with a couple of concepts. The surface will look a little darker to you, the thicker the oxide layer gets the darker the surface will be. Laser Spike Annealing for sub-20nm Logic Devices Jeff Hebb, Ph.D. Julyy, 10, 2014 1 NCCAVS Junction Technology Group Semicon West Meeting July 10, 2014. 0000003662 00000 n It is through passivation that stainless steel is protected from rust. The user team acquired close to 100,000 images on a fast Pilatus 200k detector corresponding to 3 sample materials with ~40 laser traces each. The thickness of the internal oxide layer is determined by the highest temperature reached by the surface of the metal during its heating; however, in most instances, it will remain below 3000 Ao (300nm). The standard LSA101 configuration utilizes a single narrow laser beam to heat the wafer surface from substrate temperature to the peak annealing temperature. Hence heat dissipation occurs only in one dimension (1D vertical direction). A second beam can be added to form a dual beam system that allows more flexibility to adjust the temperature profiles, and expands the process capability to low T and long dwell time. In this work, we will compare junction performance and integratablity of fast-ramp spike, flash, SPER and laser annealing down to 45nm CMOS. Ultratech, Inc. Oct 22, 2012, 04:30 ET. 257 18 xb```f``z B@1vq"F826_Z~'ERyl~tA}C^wm*E7#,Q"1)QyU466$,rx`|"W+fV!,auG'3xvG [@K;&)GE& For As, concentration enhanced diffusion is observed but can be reduced with short dwell time. This knowledge allows better design of polymer annealing processes in applications such as directed self-assembly (DSA) and could open the door for block copolymer spatially templated chemistry using laser spike annealing. To better understand the annealing windows, we developed an insitu characterization technique which matches well with laser annealing for combinatorial and highthroughput characterization; this capability significantly enhances the characterization kinetic dopant activation limitations of IIIV and IIIN materials. Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. The worlds rapid pivot to virtual everythingfrom work and school, to shopping, health care and entertainmentis straining our devices and data centers to their very limits. The service requires full JavaScript support in order to view this website. ,. Results show that the main contenders for the 45nm CMOS are SPER and . Patent Application Number is a unique ID to identify the METHODS FOR OVERLAY IMPROVEMENT THROUGH FEED FORWARD CORRECTION mark in USPTO. Built on Veeco's customizable Unity Platform, LSA 101's scanning technology delivers fundamental advantages in . Three main stages of the ion explosion spike according to Fleischer et al. 0 Over the last decade, new process technologies and materials have emerged, such as strained silicon, high-k/metal gate (HKMG) and advanced silicide. The unique nature of the LSA platform enables our . Typically, the WID temperature range for LSA for USJ processes is on the order of 5-20oC. Please enable cookies on your browser and try again. 0000004887 00000 n The key to choosing the best technology is to understand your marking requirements. Annealing is a thermal process used in the far front end of semiconductor device manufacturing to lower silicon resistance and activate dopants injected into crystalline layers for stress relaxation. The metal begins to oxidize internally. Thermal annealing is necessary to repair implant damage and activate dopants in pre silicide implantation scheme, and to drive-in dopants in post silicide case. Conversely, for material annealed at high temperature for long enough duration, the resultant morphology is purely quench determined. Construction of Polypyrrole-Coated CoSe 2 Composite Material for Lithium-Sulfur Battery It is performed before the metal layers are added, and is instrumental in providing a structurally sound foundation for . High quality p+n ultrashallow junctions were fabricated by high dose plasma doping and two step annealing involving low-temperature furnace annealing and excimer laser annealing. 0000019775 00000 n DOI: 10.1109/ASMC.2011.5898180 Corpus ID: 29379160; Laser spike annealing for nickel silicide formation @article{Hebb2011LaserSA, title={Laser spike annealing for nickel silicide formation}, author={J. P. Hebb and Yun Ran Wang and Shrinivas Shetty and J. T. Mcwhirter and David M. Owen and Michael Shen and Van Le and Jeffrey Mileham and David P. Gaines and Serguei Anikitchev and Shaoyin Chen . of 10-8 -cm2 is used. 4.9 [56], comparing the active dopant concentration for a highly doped 40-nm Si:P epitaxial layer (4.6% P content, i.e., 2.3 10 21 cm 3) for various annealing approaches, namely, epi (as reference without anneal), spike annealing . We continuously strive to improve our systems to meet continuously evolving requirements. In positionin, Achieving Ultralow-Loss Photonics Array Alignment, About the Webinar. Jacobs developed software for automatic analysis of these traces; this involved background fitting and integrating the intensity of the first order peaks (see Figure 2). R. Colin Johnson, Laser-spike annealing could boost litho, EE Times, October 2012. https://www.eetimes.com/laser-spike-annealing-could-boost-litho/. The LSA101 laser spike annealing (LSA) system enables critical millisecond annealing applications for the 28 nm node and beyond with a minimum dwell time of 200 s. See the image below. In advanced FinFET flow where contacts are formed after source/drain activation and gate stack, low thermal budget process is beneficial to minimize dopant deactivation and unintentional gate work function shift. 2017Nov 1 - Dec 21 0000000696 00000 n Beamline scientist Detlef Smilgies configured the beamline for microbeam GISAXS, providing a spatial resolution of 15 microns, at a small-angle scattering resolution of up to 40 nm [2]. We have reviewed various applications of millisecond annealing for advanced device fabrication.
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